Sigmatest 2.070

New generation portable meter to measure the electrical conductivity of non-ferromagnetic metals

Accurate and reliable conductivity measurement made easy

The SIGMATEST 2.070 is a portable eddy current instrument which measures the electrical conductivity of non-ferromagnetic metals based on the complex impedance of the measuring probe.

It determines physical and technical material properties. Typical applications include controlling the quality of manufactured products, testing material combinations, and sorting metals, alloys, and scrap metal. The unit is also used for the maintenance of aircrafts, determining heat damage, and in-process controls during production and processing in the metallurgy sector. It features five different excitation frequencies and an extremely high measuring accuracy. The unit retains this high level of accuracy even at a high frequency of 960 kHz, making it possible to measure very thin workpieces with great precision. The measuring instrument is able to automatically standardize the measured value of the electrical conductivity to 20°C due to an integrated temperature compensation. The measurement quality meets Boeings (BAC 5651) and Airbus standards.

Operating Modes
The SIGMATEST 2.070 is capable of operating in either Touch- or Continuous mode. Use Continuous mode to scan surfaces and display the measurement values in a time chart or Touch to measure single values. Use the recording function to save all measurements.

Correction Factor
Variations in the material geometry can produce a measurement error. One example is measurement on test pieces with curved (either concave or convex) surfaces. If the conductivity value of the test piece is known, the error caused by the curvature of the surface can be corrected by using a correction factor. The measured value is multiplied by the correction factor and the corrected value is displayed on the LCD.

The SIGMATEST 2.070 “remembers”
The SIGMATEST 2.070 now automatically receives the correct calibration curve from the probe. This feature is especially useful when using both 5 mm, 8 mm and 14 mm probes with the same instrument.

Temperature compensation
The SIGMATEST 2.070 compensates for temperature related electrical conductivity variations. A default temperature coefficient is installed in each instrument. In addition, the user can define a specific temperature coefficient to optimize the results for specific applications. Temperature measurement is performed using either the temperature sensor which is integrated into the probe or by connecting an external temperature sensor. An external temperature sensor is recommended when the temperature of the test piece differs from the probe temperature.

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  • Five measuring frequencies 60, 120, 240, 480, 960 kHz
    The high frequency of 960 kHz allows accurate electrical conductivity measurement on very thin pieces
  • 50 measurements per second
  • Easy operation in either touch or continous mode
  • Internal and external temperature compensation
  • Measurement possible up to 0.75 mm distance from the test item
  • Measurement range from 0.5 to 65 MS/m (1-112 % IACS)
  • Remote control by an external PC is possible via Ethernet standard RJ45. The interface allows complete control over the instrument and an integration in automated systems
  • SD-card slot for saving nearly an unlimited amount of test data
  • Probe characteristics are directly saved on the probe and automatically read by the device
  • Multilanguage operating system
  • Robust device design for operation on site

Measuring range: 0.5 to 65 MS/m or 1 to 112 % IACS
Absolute accuracy: +/- 0.7 % of measured value @60 kHz, 14 mm probe
Resolution: +/- 0.1 % of measured value
Automatic distance compensation: Up to 750 μm (0.03 inch)
Operating frequencies: 60 / 120 / 240 / 480 / 960 kHz
LCD display: 480 x 640 pixel
Power supply: 5V DC / 3000 mA
Operating time per set of batteries: 4 h
Operating voltage: Power supply and battery charger adaptable to the operating voltage in any country
Interfaces: 10 pin LEMO connector, SD card slot, Ethernet RJ45 100 Mbit/s
Temperature range: 0 °C to +40 °C (32 °F to 104 °F)
Humidity: 5 % to 85 %
Dimension: 211 x 102 x 40 mm
Weight: 0.62 kg
Standards: DIN 50994, ASTM E 1004, DIN EN 2004-1
Widths of the probe head: 5 mm, 8 mm, 14 mm